By problem

Applications

Start from the job you need to do. Each path leads to the tools and the evidence behind them.

Semiconductor

Nanoprobing and current imaging (EBIC/EBAC) for advanced-node failure analysis.

Land ultra-fine needles on individual transistors to measure their electrical behaviour at the most advanced nodes.

Materials Science

TEM lift-out, nanomanipulation and in-situ force measurement for researchers.

Cut out and lift microscopic, electron-transparent lamellae for transmission electron microscopy, faster, more accurately and more reliably.

Pick up, position and assemble nano-objects (wires, particles, flakes) inside the electron microscope.

Shape and mount the needle-shaped specimens atom probe tomography needs, by in-situ FIB lift-out.

Life Science

Patch clamping, micro-dissection and mechanical stimulation of cells and tissue.

Stable, drift-free micromanipulation for patch-clamp and intracellular recording, at the bench, in vivo, and in plant cells.

Apply precise, calibrated forces to cells and tissue, and read out how they respond.

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Tell us your sample and your microscope — we’ll walk you through the workflow and route you to the right regional team.