Tools for the Focused Ion Beam / SEM
Dual-beam FIB/SEM systems for lift-out, circuit edit and in-situ preparation.

Prober Shuttle PS8e
A compact, fully integrated nanoprobing system — now encoded for automatic probe pre-alignment at the 3 nm node and beyond.
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Prober Shuttle PS8
High-precision in-situ electrical nanoprobing with up to eight ultra-flat MM4 manipulators — for advanced-node failure analysis.
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Prober Shuttle PS4
A compact two- or four-probe nanoprobing system for in-situ electrical characterization at advanced nodes.
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NW4
A load-lock platform hosting up to four MM3A-EM manipulators — nanoprobing and failure analysis on large substrates up to 120 × 120 mm.
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ProbeWorkstation+
Up to eight manipulators, a roof-mounted prober and a 30 mm substage — a complete in-SEM probe station, installed or removed in 60 seconds.
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Heating & Cooling Stage for PS8
A heated/cooled stub for the Prober Shuttle PS8 — regulate sample temperature from −20 °C to +150 °C during probing, water-cooling-free.
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MM3E
An encoded, closed-loop micromanipulator — define parking and working positions and recall them at the click of a button.
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MM3A-EM
The industry-standard spherical micromanipulator — the platform every Kleindiek plug-in tool attaches to, with 3000+ units in the field.
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Micro Gripper MGS2
A two-jaw micro-gripper that picks up, holds and repositions micro-objects inside the electron microscope.
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Force Measurement System FMS
Laser-free force measurement and nanoindentation in the SEM — resolve forces to 10 nN and identify materials by their resonance.
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Microtweezer MTW
A piezo-driven microtweezer for pick-and-place — one jaw fixed, one jaw stepping in 0.25 nm increments across a 3 mm span.
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RoTip
A rotational-axis plug-in that adds a fourth degree of freedom — continuous 0.1° rotation for true FIB lathe milling, tomography and STEM.
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Probe-Tip Holder LCMK
A low-noise, low-resistance probe-tip holder that turns a Kleindiek manipulator into a precision nanoprober — resolving currents down to 3 fA.
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Gas Injection System GIS
A gas-injection plug-in that meters precursors and gases into the SEM chamber in precise doses, through a proportional valve driven by a Nanomotor®.
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Micro Soldering Unit MSU
A miniaturized, closed-loop soldering iron for the SEM — set a tip temperature and hold it, in air or in vacuum, for micro-scale joining.
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ACT
A four-axis Anti-Curtaining Table for true eucentric tilt during FIB cross-sectioning and TEM-slice prep.
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E5AT
A five-axis eucentric stage — unlimited rotation and ±90° tilt while keeping the region of interest centred, for ECCI, EBSD and tomography.
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6-Axis Alignment Stage
Two stacked three-axis stages for aligning two objects to each other — and the assembly to an external beam.
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LT14030
A 30 mm-travel encoded linear table with dual-encoder yaw compensation — an economical alternative to laser-interferometer stages.
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LT6820
A 20 mm closed-loop linear/Z table with 100 nm encoder repeatability for lithography, cell counting and failure analysis.
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LT6620
The open-loop 20 mm linear/Z table — large-range, high-precision positioning where encoders aren't required.
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LT3310
A compact 10 mm linear table for weight- and space-restricted nanomanipulation in SEM/FIB, UHV and at low temperature.
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SFLT3310
An ultra-low-profile 3.8 mm-tall piezo linear table — smooth XY motion in the tightest spaces, ideal paired with the Prober Shuttle.
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EBIC Amplifier
A low-noise current amplifier that turns the electron beam into a defect-mapping tool — EBIC, EBAC, RCI, EBIRCH and EBIV from a single unit.
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Micro Heating & Cooling Stage MHCS
A water-cooling-free micro heating and cooling stage — drive −60 °C to +125 °C temperature profiles on the sample, vibration-free.
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Micro Heating Stage MHS
A miniaturized heating stage with closed-loop control — up to 200 °C, or 450 °C with the MHS450 variant.
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Nanolathe (RT-LATHE)
A stand-alone rotational axis for true FIB lathe milling and tomography — spin a region of interest concentrically under the beam.
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SpringTable & Force Measurement Analysis
A low-tech SpringTable that converts the SEM's own resolution into quantitative force–distance curves.
View productResearch on the FIB-SEM
Weld-free mounting of lamellae for electrical biasing operando TEM
DOI 10.1016/j.ultramic.2024.113939Exploring the conduction in atomic-sized metallic constrictions created by controlled ion etching
DOI 10.1088/0957-4484/19/41/415302Integrated setup for the fabrication and measurement of magnetoresistive nanoconstrictions in ultrahigh vacuum
DOI 10.1063/1.2981693Not sure it fits your FIB-SEM?
Interfacing solutions exist for most commercial microscopes — OEM-integrated or retrofit. Tell us your model and we'll confirm the mount.
